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CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?

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Paper Details

Authors:
Submitted On:
21 September 2017 - 10:18am
Short Link:
Type:
Poster
Event:
Presenter's Name:
Xinwei Liu
Paper Code:
1899
Document Year:
2017
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Document Files

Landscape_Poster_ICIP_Xinwei LIU.pdf

(21 downloads)

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[1] , "CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?", IEEE SigPort, 2017. [Online]. Available: http://sigport.org/2243. Accessed: Oct. 23, 2017.
@article{2243-17,
url = {http://sigport.org/2243},
author = { },
publisher = {IEEE SigPort},
title = {CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?},
year = {2017} }
TY - EJOUR
T1 - CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?
AU -
PY - 2017
PB - IEEE SigPort
UR - http://sigport.org/2243
ER -
. (2017). CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?. IEEE SigPort. http://sigport.org/2243
, 2017. CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?. Available at: http://sigport.org/2243.
. (2017). "CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY?." Web.
1. . CAN NO-REFERENCE IMAGE QUALITY METRICS ASSESS VISIBLE WAVELENGTH IRIS SAMPLE QUALITY? [Internet]. IEEE SigPort; 2017. Available from : http://sigport.org/2243