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General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models

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Paper Details

Authors:
Wei Fan
Submitted On:
23 February 2016 - 1:44pm
Short Link:
Type:
Presentation Slides
Event:
Presenter's Name:
Wei Fan
Document Year:
2015
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Document Files

WIFS2015_Fan.pdf

(186 downloads)

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[1] Wei Fan, "General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models", IEEE SigPort, 2016. [Online]. Available: http://sigport.org/580. Accessed: May. 24, 2017.
@article{580-16,
url = {http://sigport.org/580},
author = {Wei Fan },
publisher = {IEEE SigPort},
title = {General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models},
year = {2016} }
TY - EJOUR
T1 - General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models
AU - Wei Fan
PY - 2016
PB - IEEE SigPort
UR - http://sigport.org/580
ER -
Wei Fan. (2016). General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models. IEEE SigPort. http://sigport.org/580
Wei Fan, 2016. General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models. Available at: http://sigport.org/580.
Wei Fan. (2016). "General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models." Web.
1. Wei Fan. General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models [Internet]. IEEE SigPort; 2016. Available from : http://sigport.org/580