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Image Scanning, Display, and Printing

FROM FOCAL STACKS TO TENSOR DISPLAY: A METHOD FOR LIGHT FIELD VISUALIZATION WITHOUT MULTI-VIEW IMAGES


A new type of light field display called a tensor display was investigated. Although this display consists of only a few light attenuating
layers located in front of a backlight, many views can be emitted in different directions simultaneously without sacrificing the resolution
of each view. The transmittance pattern of each layer is calculated from a light field, namely, a set of dense multi-view images (typically
dozens) that are to be observed from different directions. However, preparing such images is often cumbersome for real objects. We propose

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Authors:
Keita Takahashi, Toshiaki Fujii
Submitted On:
11 March 2017 - 8:48pm
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icassp_poster_2.pdf

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[1] Keita Takahashi, Toshiaki Fujii, "FROM FOCAL STACKS TO TENSOR DISPLAY: A METHOD FOR LIGHT FIELD VISUALIZATION WITHOUT MULTI-VIEW IMAGES", IEEE SigPort, 2017. [Online]. Available: http://sigport.org/1575. Accessed: Jun. 29, 2017.
@article{1575-17,
url = {http://sigport.org/1575},
author = {Keita Takahashi; Toshiaki Fujii },
publisher = {IEEE SigPort},
title = {FROM FOCAL STACKS TO TENSOR DISPLAY: A METHOD FOR LIGHT FIELD VISUALIZATION WITHOUT MULTI-VIEW IMAGES},
year = {2017} }
TY - EJOUR
T1 - FROM FOCAL STACKS TO TENSOR DISPLAY: A METHOD FOR LIGHT FIELD VISUALIZATION WITHOUT MULTI-VIEW IMAGES
AU - Keita Takahashi; Toshiaki Fujii
PY - 2017
PB - IEEE SigPort
UR - http://sigport.org/1575
ER -
Keita Takahashi, Toshiaki Fujii. (2017). FROM FOCAL STACKS TO TENSOR DISPLAY: A METHOD FOR LIGHT FIELD VISUALIZATION WITHOUT MULTI-VIEW IMAGES. IEEE SigPort. http://sigport.org/1575
Keita Takahashi, Toshiaki Fujii, 2017. FROM FOCAL STACKS TO TENSOR DISPLAY: A METHOD FOR LIGHT FIELD VISUALIZATION WITHOUT MULTI-VIEW IMAGES. Available at: http://sigport.org/1575.
Keita Takahashi, Toshiaki Fujii. (2017). "FROM FOCAL STACKS TO TENSOR DISPLAY: A METHOD FOR LIGHT FIELD VISUALIZATION WITHOUT MULTI-VIEW IMAGES." Web.
1. Keita Takahashi, Toshiaki Fujii. FROM FOCAL STACKS TO TENSOR DISPLAY: A METHOD FOR LIGHT FIELD VISUALIZATION WITHOUT MULTI-VIEW IMAGES [Internet]. IEEE SigPort; 2017. Available from : http://sigport.org/1575

A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents


The digital scans of double sided documents suffer from distortions because the contents on the back side of the document often shows up on the front side in the scans and vice-versa either due to transparency of the paper or due to ink-bleeding. This is show-through effect. In this paper a state-space based approach is proposed for removing this commonly found contamination in the scans of duplex printed documents. Separate state-space representation for signals and parameters are defined and a dual state-parameter estimation approach is employed to alleviate the degradation in the scans.

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Authors:
Sabita Langkam, Alok Kanti Deb
Submitted On:
2 March 2017 - 12:24am
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A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents

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[1] Sabita Langkam, Alok Kanti Deb, "A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents", IEEE SigPort, 2017. [Online]. Available: http://sigport.org/1572. Accessed: Jun. 29, 2017.
@article{1572-17,
url = {http://sigport.org/1572},
author = {Sabita Langkam; Alok Kanti Deb },
publisher = {IEEE SigPort},
title = {A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents},
year = {2017} }
TY - EJOUR
T1 - A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents
AU - Sabita Langkam; Alok Kanti Deb
PY - 2017
PB - IEEE SigPort
UR - http://sigport.org/1572
ER -
Sabita Langkam, Alok Kanti Deb. (2017). A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents. IEEE SigPort. http://sigport.org/1572
Sabita Langkam, Alok Kanti Deb, 2017. A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents. Available at: http://sigport.org/1572.
Sabita Langkam, Alok Kanti Deb. (2017). "A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents." Web.
1. Sabita Langkam, Alok Kanti Deb. A Dual Estimation Approach for Removing the Show-Through Effect in the Scanned Documents [Internet]. IEEE SigPort; 2017. Available from : http://sigport.org/1572

Scanned Document Enhancement Based on Fast Text Detection

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Authors:
Jobin J Mathew, Eli Saber, David Larson, Peter Bauer, George Kerby, Jerry Wagner
Submitted On:
23 March 2016 - 8:47am
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ICASSP2016_Poster.pdf

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[1] Jobin J Mathew, Eli Saber, David Larson, Peter Bauer, George Kerby, Jerry Wagner, "Scanned Document Enhancement Based on Fast Text Detection", IEEE SigPort, 2016. [Online]. Available: http://sigport.org/990. Accessed: Jun. 29, 2017.
@article{990-16,
url = {http://sigport.org/990},
author = {Jobin J Mathew; Eli Saber; David Larson; Peter Bauer; George Kerby; Jerry Wagner },
publisher = {IEEE SigPort},
title = {Scanned Document Enhancement Based on Fast Text Detection},
year = {2016} }
TY - EJOUR
T1 - Scanned Document Enhancement Based on Fast Text Detection
AU - Jobin J Mathew; Eli Saber; David Larson; Peter Bauer; George Kerby; Jerry Wagner
PY - 2016
PB - IEEE SigPort
UR - http://sigport.org/990
ER -
Jobin J Mathew, Eli Saber, David Larson, Peter Bauer, George Kerby, Jerry Wagner. (2016). Scanned Document Enhancement Based on Fast Text Detection. IEEE SigPort. http://sigport.org/990
Jobin J Mathew, Eli Saber, David Larson, Peter Bauer, George Kerby, Jerry Wagner, 2016. Scanned Document Enhancement Based on Fast Text Detection. Available at: http://sigport.org/990.
Jobin J Mathew, Eli Saber, David Larson, Peter Bauer, George Kerby, Jerry Wagner. (2016). "Scanned Document Enhancement Based on Fast Text Detection." Web.
1. Jobin J Mathew, Eli Saber, David Larson, Peter Bauer, George Kerby, Jerry Wagner. Scanned Document Enhancement Based on Fast Text Detection [Internet]. IEEE SigPort; 2016. Available from : http://sigport.org/990

Accurate Recovery of a Specularity from a few Samples of the Reflectance Function

Paper Details

Authors:
Ivan Dokmanić, Loïc Baboulaz, Martin Vetterli
Submitted On:
17 March 2016 - 3:32am
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Poster_vertical_3.pdf

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[1] Ivan Dokmanić, Loïc Baboulaz, Martin Vetterli, "Accurate Recovery of a Specularity from a few Samples of the Reflectance Function", IEEE SigPort, 2016. [Online]. Available: http://sigport.org/736. Accessed: Jun. 29, 2017.
@article{736-16,
url = {http://sigport.org/736},
author = {Ivan Dokmanić; Loïc Baboulaz; Martin Vetterli },
publisher = {IEEE SigPort},
title = {Accurate Recovery of a Specularity from a few Samples of the Reflectance Function},
year = {2016} }
TY - EJOUR
T1 - Accurate Recovery of a Specularity from a few Samples of the Reflectance Function
AU - Ivan Dokmanić; Loïc Baboulaz; Martin Vetterli
PY - 2016
PB - IEEE SigPort
UR - http://sigport.org/736
ER -
Ivan Dokmanić, Loïc Baboulaz, Martin Vetterli. (2016). Accurate Recovery of a Specularity from a few Samples of the Reflectance Function. IEEE SigPort. http://sigport.org/736
Ivan Dokmanić, Loïc Baboulaz, Martin Vetterli, 2016. Accurate Recovery of a Specularity from a few Samples of the Reflectance Function. Available at: http://sigport.org/736.
Ivan Dokmanić, Loïc Baboulaz, Martin Vetterli. (2016). "Accurate Recovery of a Specularity from a few Samples of the Reflectance Function." Web.
1. Ivan Dokmanić, Loïc Baboulaz, Martin Vetterli. Accurate Recovery of a Specularity from a few Samples of the Reflectance Function [Internet]. IEEE SigPort; 2016. Available from : http://sigport.org/736