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A Low-Complexity Metric for the Estimation of Perceived Chrominance Sub-Sampling Errors in Screen Content Images

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Paper Details

Authors:
Eugen Wige, Felix Fleckenstein, Benjamin Prestele, Alexander Gehlert, and André Kaup
Submitted On:
12 September 2017 - 11:00am
Short Link:
Type:
Poster
Event:
Presenter's Name:
Andreas Heindel
Document Year:
2017
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Document Files

ICIP2017_Heindel_Poster_final.pdf

(25 downloads)

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[1] Eugen Wige, Felix Fleckenstein, Benjamin Prestele, Alexander Gehlert, and André Kaup, "A Low-Complexity Metric for the Estimation of Perceived Chrominance Sub-Sampling Errors in Screen Content Images", IEEE SigPort, 2017. [Online]. Available: http://sigport.org/1944. Accessed: Nov. 23, 2017.
@article{1944-17,
url = {http://sigport.org/1944},
author = {Eugen Wige; Felix Fleckenstein; Benjamin Prestele; Alexander Gehlert; and André Kaup },
publisher = {IEEE SigPort},
title = {A Low-Complexity Metric for the Estimation of Perceived Chrominance Sub-Sampling Errors in Screen Content Images},
year = {2017} }
TY - EJOUR
T1 - A Low-Complexity Metric for the Estimation of Perceived Chrominance Sub-Sampling Errors in Screen Content Images
AU - Eugen Wige; Felix Fleckenstein; Benjamin Prestele; Alexander Gehlert; and André Kaup
PY - 2017
PB - IEEE SigPort
UR - http://sigport.org/1944
ER -
Eugen Wige, Felix Fleckenstein, Benjamin Prestele, Alexander Gehlert, and André Kaup. (2017). A Low-Complexity Metric for the Estimation of Perceived Chrominance Sub-Sampling Errors in Screen Content Images. IEEE SigPort. http://sigport.org/1944
Eugen Wige, Felix Fleckenstein, Benjamin Prestele, Alexander Gehlert, and André Kaup, 2017. A Low-Complexity Metric for the Estimation of Perceived Chrominance Sub-Sampling Errors in Screen Content Images. Available at: http://sigport.org/1944.
Eugen Wige, Felix Fleckenstein, Benjamin Prestele, Alexander Gehlert, and André Kaup. (2017). "A Low-Complexity Metric for the Estimation of Perceived Chrominance Sub-Sampling Errors in Screen Content Images." Web.
1. Eugen Wige, Felix Fleckenstein, Benjamin Prestele, Alexander Gehlert, and André Kaup. A Low-Complexity Metric for the Estimation of Perceived Chrominance Sub-Sampling Errors in Screen Content Images [Internet]. IEEE SigPort; 2017. Available from : http://sigport.org/1944