[1] Michael Schäfer, Jonathan Pfaff, Jennifer Rasch, Tobias Hinz, Heiko Schwarz, Tung Nguyen, Gerhard Tech, Detlev Marpe, Thomas Wiegand,
"Improved Prediction via Thresholding Transform Coefficients",
IEEE SigPort,
2018. [Online]. Available: http://sigport.org/3393. Accessed: Feb. 17, 2019.
@article{3393-18,
url = {http://sigport.org/3393},
author = {Michael Schäfer; Jonathan Pfaff; Jennifer Rasch; Tobias Hinz; Heiko Schwarz; Tung Nguyen; Gerhard Tech; Detlev Marpe; Thomas Wiegand },
publisher = {IEEE SigPort},
title = {Improved Prediction via Thresholding Transform Coefficients},
year = {2018}
}
TY - EJOUR
T1 - Improved Prediction via Thresholding Transform Coefficients
AU - Michael Schäfer; Jonathan Pfaff; Jennifer Rasch; Tobias Hinz; Heiko Schwarz; Tung Nguyen; Gerhard Tech; Detlev Marpe; Thomas Wiegand
PY - 2018
PB - IEEE SigPort
UR - http://sigport.org/3393
ER -
Michael Schäfer, Jonathan Pfaff, Jennifer Rasch, Tobias Hinz, Heiko Schwarz, Tung Nguyen, Gerhard Tech, Detlev Marpe, Thomas Wiegand.
(2018).
Improved Prediction via Thresholding Transform Coefficients.
IEEE SigPort.
http://sigport.org/3393
Michael Schäfer, Jonathan Pfaff, Jennifer Rasch, Tobias Hinz, Heiko Schwarz, Tung Nguyen, Gerhard Tech, Detlev Marpe, Thomas Wiegand,
2018.
Improved Prediction via Thresholding Transform Coefficients.
Available at:
http://sigport.org/3393.
Michael Schäfer, Jonathan Pfaff, Jennifer Rasch, Tobias Hinz, Heiko Schwarz, Tung Nguyen, Gerhard Tech, Detlev Marpe, Thomas Wiegand.
(2018).
"Improved Prediction via Thresholding Transform Coefficients."
Web.
1. Michael Schäfer, Jonathan Pfaff, Jennifer Rasch, Tobias Hinz, Heiko Schwarz, Tung Nguyen, Gerhard Tech, Detlev Marpe, Thomas Wiegand.
Improved Prediction via Thresholding Transform Coefficients [Internet].
IEEE SigPort; 2018.
Available from :
http://sigport.org/3393