Skip to main content
IEEE.org
IEEE
Xplore
Digital Library
IEEE Standards
IEEE Spectrum
More Sites
About SigPort
Login
Create Account
Documents
Events
Submit Your Work
Search
Sebastien Combrexelle
Primary tabs
View
(active tab)
Track
Author's Documents
A Bayesian framework for the multifractal analysis of images using data augmentation and a Whittle approximation
24 March 2016 - 10:06pm
639 Downloads
Sebastien Combrexelle
Read More
