General-Purpose Image Forensics Using Patch Likelihood under Image Statistical Models

Citation Author(s):: SPS WIFS2015

Wei Fan
Submitted by:: sigadmin
Last updated:: 23 February 2016 - 1:44pm
Document Type:: Presentation Slides
Document Year:: 2015
Event:: WIFS 2015
Presenters:: Wei Fan

Categories:: Information Forensics and Security

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