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A Metrological Measurement of Texture in Hyperspectral Images using Relocated Spectral Difference Occurrence Matrix

Abstract: 

A new hyperspectral texture descriptor, Relocated Spectral Difference Occurrence Matrix (rSDOM) is proposed. It assesses the distribution of spectral difference in a given neighborhood. For metrological purposes, rSDOM employs Kullback-Leibler pseudo-divergence (KLPD) for spectral difference calculation. It is generic and adapted for any spectral range and number of band. As validation, a texture classification scheme based on nearest neighbor classifier is applied on HyTexiLa dataset using rSDOM. The performance is close to Opponent Band Local Binary Pattern (OBLBP) with classification accuracy of 94.7 %, but at a much-reduced feature size (0.24 % of OBLBP's) and computational complexity.

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Paper Details

Authors:
Rui Jian Chu, Noel Richard, Christine Fernandez-Maloigne, Jon Yngve Hardeberg
Submitted On:
20 September 2019 - 11:28am
Short Link:
Type:
Presentation Slides
Event:
Presenter's Name:
Rui Jian Chu
Paper Code:
2765
Document Year:
2019
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Document Files

rSDOM_ICIP2019.pdf

(23)

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[1] Rui Jian Chu, Noel Richard, Christine Fernandez-Maloigne, Jon Yngve Hardeberg, "A Metrological Measurement of Texture in Hyperspectral Images using Relocated Spectral Difference Occurrence Matrix", IEEE SigPort, 2019. [Online]. Available: http://sigport.org/4785. Accessed: Dec. 08, 2019.
@article{4785-19,
url = {http://sigport.org/4785},
author = {Rui Jian Chu; Noel Richard; Christine Fernandez-Maloigne; Jon Yngve Hardeberg },
publisher = {IEEE SigPort},
title = {A Metrological Measurement of Texture in Hyperspectral Images using Relocated Spectral Difference Occurrence Matrix},
year = {2019} }
TY - EJOUR
T1 - A Metrological Measurement of Texture in Hyperspectral Images using Relocated Spectral Difference Occurrence Matrix
AU - Rui Jian Chu; Noel Richard; Christine Fernandez-Maloigne; Jon Yngve Hardeberg
PY - 2019
PB - IEEE SigPort
UR - http://sigport.org/4785
ER -
Rui Jian Chu, Noel Richard, Christine Fernandez-Maloigne, Jon Yngve Hardeberg. (2019). A Metrological Measurement of Texture in Hyperspectral Images using Relocated Spectral Difference Occurrence Matrix. IEEE SigPort. http://sigport.org/4785
Rui Jian Chu, Noel Richard, Christine Fernandez-Maloigne, Jon Yngve Hardeberg, 2019. A Metrological Measurement of Texture in Hyperspectral Images using Relocated Spectral Difference Occurrence Matrix. Available at: http://sigport.org/4785.
Rui Jian Chu, Noel Richard, Christine Fernandez-Maloigne, Jon Yngve Hardeberg. (2019). "A Metrological Measurement of Texture in Hyperspectral Images using Relocated Spectral Difference Occurrence Matrix." Web.
1. Rui Jian Chu, Noel Richard, Christine Fernandez-Maloigne, Jon Yngve Hardeberg. A Metrological Measurement of Texture in Hyperspectral Images using Relocated Spectral Difference Occurrence Matrix [Internet]. IEEE SigPort; 2019. Available from : http://sigport.org/4785