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Stage-Regularized Neural Stein Critics for Testing Goodness-of-Fit of Generative Models

DOI:
10.60864/24wj-hj52
Citation Author(s):
Matthew Repasky, Xiuyuan Cheng, Yao Xie
Submitted by:
Matthew Repasky
Last updated:
6 June 2024 - 10:50am
Document Type:
Poster
Document Year:
2024
Event:
Presenters:
Yao Xie
Paper Code:
MLSP-P1.11
 

Learning to differentiate model distributions from observed data is a fundamental problem in statistics and machine learning, and high-dimensional data remains a challenging setting for such problems. Metrics that quantify the disparity in probability distributions, such as the Stein discrepancy, play an important role in high-dimensional statistical testing. This paper presents a method based on neural network Stein critics to distinguish between data sampled from an unknown probability distribution and a nominal model distribution with a novel staging of the weight of regularization. The benefit of using staged L2 regularization in training such critics is demonstrated on evaluating generative models of image data.

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