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Visual content is increasingly being used for more than human viewing. For example, traffic video is automatically analyzed to count vehicles, detect traffic violations, estimate traffic intensity, and recognize license plates; images uploaded to social media are automatically analyzed to detect and recognize people, organize images into thematic collections, and so on; visual sensors on autonomous vehicles analyze captured signals to help the vehicle navigate, avoid obstacles, collisions, and optimize their movement.

This paper addresses the problem of defect segmentation in semiconductor manufacturing. The input of our segmentation is a scanning-electron-microscopy (SEM) image of the candidate defect region. We train a U-net shape network to segment defects using a dataset of clean background images. The samples of the training phase are produced automatically such that no manual labeling is required. To enrich the dataset of clean background samples, we apply defect implant augmentation. To that end, we apply a copy-and-paste of a random image patch in the clean specimen.