[1] Maruf A. Dhali, Gavin Gibson, Yan Yan, James R. Hopgood, Vassilis Sboros,
"Super-resolution spectral analysis for ultrasound scatter characterization",
IEEE SigPort,
2016. [Online]. Available: http://sigport.org/615. Accessed: Dec. 14, 2019.
@article{615-16,
url = {http://sigport.org/615},
author = {Maruf A. Dhali; Gavin Gibson; Yan Yan; James R. Hopgood; Vassilis Sboros },
publisher = {IEEE SigPort},
title = {Super-resolution spectral analysis for ultrasound scatter characterization},
year = {2016}
}
TY - EJOUR
T1 - Super-resolution spectral analysis for ultrasound scatter characterization
AU - Maruf A. Dhali; Gavin Gibson; Yan Yan; James R. Hopgood; Vassilis Sboros
PY - 2016
PB - IEEE SigPort
UR - http://sigport.org/615
ER -
Maruf A. Dhali, Gavin Gibson, Yan Yan, James R. Hopgood, Vassilis Sboros.
(2016).
Super-resolution spectral analysis for ultrasound scatter characterization.
IEEE SigPort.
http://sigport.org/615
Maruf A. Dhali, Gavin Gibson, Yan Yan, James R. Hopgood, Vassilis Sboros,
2016.
Super-resolution spectral analysis for ultrasound scatter characterization.
Available at:
http://sigport.org/615.
Maruf A. Dhali, Gavin Gibson, Yan Yan, James R. Hopgood, Vassilis Sboros.
(2016).
"Super-resolution spectral analysis for ultrasound scatter characterization."
Web.
1. Maruf A. Dhali, Gavin Gibson, Yan Yan, James R. Hopgood, Vassilis Sboros.
Super-resolution spectral analysis for ultrasound scatter characterization [Internet].
IEEE SigPort; 2016.
Available from :
http://sigport.org/615